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 SemiWell Semiconductor
SFP45N03L
Logic N-Channel MOSFET
Features

Low RDS(on) (0.018 )@VGS=10V Low Gate Charge (Typical 17.5nC) Low Crss (Typical 110pF) Improved dv/dt Capability 100% Avalanche Tested Maximum Junction Temperature Range (175C)
Symbol
2. Drain
1. Gate

3. Source
General Description
This Power MOSFET is produced using SemiWell's advanced planar stripe, DMOS technology. This latest technology has been especially designed to minimize on-state resistance, have a low gate charge with superior switching performance, and rugged avalanche characteristics. This Power MOSFET is well suited for synchronous DC-DC Converters and Power Management in portable and battery operated products.
TO-220
12
3
Absolute Maximum Ratings
Symbol
VDSS ID IDM VGS EAS dv/dt PD TSTG, TJ TL Drain to Source Voltage Continuous Drain Current(@TC = 25C) Continuous Drain Current(@TC = 100C) Drain Current Pulsed Gate to Source Voltage Single Pulsed Avalanche Energy Peak Diode Recovery dv/dt Total Power Dissipation(@TC = 25 C) Derating Factor above 25 C Operating Junction Temperature & Storage Temperature Maximum Lead Temperature for soldering purpose, 1/8 from Case for 5 seconds.
(Note 2) (Note 3) (Note 1)
Parameter
Value
30 45 32.3 180
Units
V A A A V mJ V/ns W W/C C C
20
220 7.0 75 0.5 - 55 ~ 175 300
Thermal Characteristics
Symbol
RJC RCS RJA
Parameter
Thermal Resistance, Junction-to-Case Thermal Resistance, Case to Sink Thermal Resistance, Junction-to-Ambient
Value Min.
-
Typ.
0.5 -
Max.
2.0 62.5
Units
C/W C/W C/W
September., 2002. Rev. 0.
Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved.
1/7
SFP45N03L
Electrical Characteristics
Symbol Off Characteristics
BVDSS BVDSS/ TJ IDSS Drain-Source Breakdown Voltage Breakdown Voltage Temperature coefficient Drain-Source Leakage Current Gate-Source Leakage, Forward Gate-Source Leakage, Reverse VGS = 0V, ID = 250uA ID = 250uA, referenced to 25 C VDS = 30V, VGS = 0V VDS = 24V, TC = 150 C VGS = 20V, VDS = 0V VGS = -20V, VDS = 0V VDS = VGS, ID = 250uA VGS = 10 V, ID = 22.5A VGS = 5 V, ID = 22.5A 30 0.03 1 10 100 -100 V V/C uA uA nA nA ( TC = 25 C unless otherwise noted )
Parameter
Test Conditions
Min
Typ
Max
Units
IGSS
On Characteristics
VGS(th) RDS(ON) Gate Threshold Voltage Static Drain-Source On-state Resistance 1.0 0.013 0.019 3.0 0.018 0.025 V
Dynamic Characteristics
Ciss Coss Crss td(on) tr td(off) tf Qg Qgs Qgd Input Capacitance Output Capacitance Reverse Transfer Capacitance VGS =0 V, VDS =25V, f = 1MHz 880 370 110 1140 480 140 pF
Dynamic Characteristics
Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Total Gate Charge Gate-Source Charge Gate-Drain Charge(Miller Charge) VDS =24V, VGS =5V, ID =45A see fig. 12.
(Note 4, 5)
VDD =15V, ID =22.5A, RG =50 see fig. 13.
(Note 4, 5)
20 60 45 60 17.5 5.0 7.5
50 130 100 130 23 nC ns
-
Source-Drain Diode Ratings and Characteristics
Symbol
IS ISM VSD trr Qrr NOTES
1. Repeativity rating : pulse width limited by junction temperature 2. L =110uH, IAS =45A, VDD = 15V, RG = 0 , Starting TJ = 25C 3. ISD 45A, di/dt 300A/us, VDD BVDSS, Starting TJ = 25C 4. Pulse Test : Pulse Width 300us, Duty Cycle 2% 5. Essentially independent of operating temperature.
Parameter
Continuous Source Current Pulsed Source Current Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge
Test Conditions
Integral Reverse p-n Junction Diode in the MOSFET IS =45A, VGS =0V IS=45A,VGS=0V,dIF/dt=100A/us
Min.
-
Typ.
35 30
Max.
45 180 1.5 -
Unit.
A V ns nC
2/7
SFP45N03L
Fig 1. On-State Characteristics
VGS 10.0 V 8.0 V 6.0 V 5.0 V 4.5 V 4.0 V 3.5 V Bottom : 3.0 V Top :
Fig 2. Transfer Characteristics
10
2
10
2
ID, Drain Current [A]
ID, Drain Current [A]
10
1
10
1
175 C 25 C -55 C
o o
o
10
0
Notes : 1. 250 s Pulse Test 2. TC = 25
Notes : 1. VDS = 15V 2. 250 s Pulse Test
10 -1 10
0
10
0
10
1
10
-1
0
2
4
6
8
10
VDS, Drain-Source Voltage [V]
VGS, Gate-Source Voltage [V]
Fig 3. On Resistance Variation vs. Drain Current and Gate Voltage
50
Fig 4. On State Current vs. Allowable Case Temperature
10
2
RDS(ON), Drain-Source On-Resistance[m ]
VGS = 5V
30
IDR, Reverse Drain Current[A]
40
VGS = 10V
10
1
20
10
0
175 25
Notes : 1. VGS = 0V 2. 250 s Pulse Test
10
Note : TJ = 25
0
0
50
100
150
200
250
300
10
-1
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
ID, Drain Current [A]
VSD, Source-Drain voltage[V]
Fig 5. Capacitance Characteristics
2500
Ciss=Cgs+Cgd(Cds=shorted) Coss=Cds+Cgd Crss=Cgd
Fig 6. Gate Charge Characteristics
12
VGS, Gate-Source Voltage [V]
2000
10
VDS = 15V VDS = 24V
Capacitance [pF]
1500
Notes : 1. VGS = 0V 2. f=1MHz
8
6
1000
Ciss Coss
4
500
2
Note : ID = 45.0 A
Crss
0 0 5 10 15 20 25 30 35
0 0 5 10 15 20 25 30
35
40
45
VDS, Drain-Source Voltage [V]
Qg, Total Gate Charge [nC]
3/7
SFP45N03L
Fig 7. Breakdown Voltage Variation vs. Junction Temperature
1.2
2.5
Fig 8. On-Resistance Variation vs. Junction Temperature
BVDSS, (Normalized) Drain-Source Breakdown Voltage
RDS(ON), (Normalized) Drain-Source On-Resistance
2.0
1.1
1.5
1.0
1.0
0.9
Notes : 1. VGS = 0 V 2. ID = 250 A
0.5
Notes : 1. VGS = 10 V 2. ID = 22.5 A
0.8 -100
-50
0
50
100
o
150
200
0.0 -100
-50
0
50
100
o
150
200
TJ, Junction Temperature [ C]
TJ, Junction Temperature [ C]
Fig 9. Maximum Safe Operating Area
50
Operation in This Area is Limited by R DS(on)
Fig 10. Maximum Drain Current vs. Case Temperature
ID, Drain Current [A]
10
2
100 s 1 ms 10 ms DC
40
ID' Drain Current [A]
30
10
1
20
Notes :
1. TC = 25 C
o
10
10
0
2. TJ = 175 C 3. Single Pulse
o
10
-1
10
0
10
1
0 25
50
75
100
125
o
150
175
VDS, Drain-Source Voltage [V]
TC' Case Temperature [ C]
Fig 11. Transient Thermal Response Curve
Z JC Thermal Response (t),
10
0
D = 0.5 0 .2 0 .1
N otes : 1. Z JC = 2.0 /W M ax. (t) 2. D uty F ac tor, D = t 1 /t 2 3. T JM - T C = P D M * Z JC (t)
10
-1
0.0 5 0.02 0.0 1 single pulse
10
-2
10
-5
10
-4
10
-3
10
-2
10
-1
10
0
10
1
t 1 , S q u a re W a ve P u lse D ura tio n [se c]
4/7
SFP45N03L
Fig. 12. Gate Charge Test Circuit & Waveforms
50K 12V 200nF 300nF
Same Type as DUT VDS
VGS Qg 5V Qgs Qgd
VGS
DUT
1mA
Charge
Fig 13. Switching Time Test Circuit & Waveforms
VDS
RL VDD
( 0.5 rated V DS )
VDS
90%
5V Pulse Generator RG
DUT
Vin
10%
td(on) t on
tr
td(off) t off
tf
Fig 14. Unclamped Inductive Switching Test Circuit & Waveforms
VDS ID RG
L VDD
BVDSS 1 EAS = ---- LL IAS2 -------------------2 BVDSS -- VDD BVDSS IAS ID (t)
10V
DUT
VDD
tp
VDS (t) Time
5/7
SFP45N03L
Fig. 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms
DUT
+ VDS _
IS
L
Driver RG
Same Type as DUT
VDD
VGS
* dv/dt controlled by RG * IS controlled by pulse period
VGS ( Driver )
Gate Pulse Width D = -------------------------Gate Pulse Period
10V
IFM , Body Diode Forward Current
IS ( DUT ) IRM
di/dt
Body Diode Reverse Current
VDS ( DUT )
Body Diode Recovery dv/dt
Vf
VDD
Body Diode Forward Voltage Drop
6/7
SFP45N03L
TO-220 Package Dimension
Dim. A B C D E F G H I J K L M N O
Min. 9.7 6.3 9.0 12.8 1.2
mm Typ.
Max. 10.1 6.7 9.47 13.3 1.4
Min. 0.382 0.248 0.354 0.504 0.047
Inch Typ.
Max. 0.398 0.264 0.373 0.524 0.055
1.7 2.5 3.0 1.25 2.4 5.0 2.2 1.25 0.45 0.6 3.6 3.4 1.4 2.7 5.15 2.6 1.55 0.6 1.0 0.118 0.049 0.094 0.197 0.087 0.049 0.018 0.024
0.067 0.098 0.134 0.055 0.106 0.203 0.102 0.061 0.024 0.039 0.142
O
E B
A
H
I
F
C M
G 1 D 2 3
L
1. Gate 2. Drain 3. Source
N O
J K
7/7


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